B. Belin Et Al. , "Determination of ion dose and profiles in Ge-74 and Sn-120 implanted silicon layers by PIXE, NAA, RBS and SIMS," JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY , vol.261, no.2, pp.479-483, 2004
Belin, B. Et Al. 2004. Determination of ion dose and profiles in Ge-74 and Sn-120 implanted silicon layers by PIXE, NAA, RBS and SIMS. JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY , vol.261, no.2 , 479-483.
Belin, B., Bode, P., Turan, R., & Van Meerten, T., (2004). Determination of ion dose and profiles in Ge-74 and Sn-120 implanted silicon layers by PIXE, NAA, RBS and SIMS. JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY , vol.261, no.2, 479-483.
Belin, B Et Al. "Determination of ion dose and profiles in Ge-74 and Sn-120 implanted silicon layers by PIXE, NAA, RBS and SIMS," JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY , vol.261, no.2, 479-483, 2004
Belin, B Et Al. "Determination of ion dose and profiles in Ge-74 and Sn-120 implanted silicon layers by PIXE, NAA, RBS and SIMS." JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY , vol.261, no.2, pp.479-483, 2004
Belin, B. Et Al. (2004) . "Determination of ion dose and profiles in Ge-74 and Sn-120 implanted silicon layers by PIXE, NAA, RBS and SIMS." JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY , vol.261, no.2, pp.479-483.
@article{article, author={B Belin Et Al. }, title={Determination of ion dose and profiles in Ge-74 and Sn-120 implanted silicon layers by PIXE, NAA, RBS and SIMS}, journal={JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY}, year=2004, pages={479-483} }