M. B. Yelten Et Al. , "Scalable and Efficient Analog Parametric Fault Identification," 32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD) , San-Jose, Costa Rica, pp.387-392, 2013
Yelten, M. B. Et Al. 2013. Scalable and Efficient Analog Parametric Fault Identification. 32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD) , (San-Jose, Costa Rica), 387-392.
Yelten, M. B., NATARAJAN, S., XUE, B., & GOTETİ, P., (2013). Scalable and Efficient Analog Parametric Fault Identification . 32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (pp.387-392). San-Jose, Costa Rica
Yelten, Mustafa Et Al. "Scalable and Efficient Analog Parametric Fault Identification," 32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San-Jose, Costa Rica, 2013
Yelten, Mustafa B. Et Al. "Scalable and Efficient Analog Parametric Fault Identification." 32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD) , San-Jose, Costa Rica, pp.387-392, 2013
Yelten, M. B. Et Al. (2013) . "Scalable and Efficient Analog Parametric Fault Identification." 32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD) , San-Jose, Costa Rica, pp.387-392.
@conferencepaper{conferencepaper, author={Mustafa Berke Yelten Et Al. }, title={Scalable and Efficient Analog Parametric Fault Identification}, congress name={32nd IEEE/ACM International Conference on Computer-Aided Design (ICCAD)}, city={San-Jose}, country={Costa Rica}, year={2013}, pages={387-392} }