B. Caglayan Et Al. , "Dione an integrated measurement and defect prediction solution," Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12 , Cary, North Carolina, 2012
Caglayan, B. Et Al. 2012. Dione an integrated measurement and defect prediction solution. Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12 , (Cary, North Carolina) .
Caglayan, B., TOSUN, A., Gul, C., Ayse, B., Aytac, T., & Turhan, B., (2012). Dione an integrated measurement and defect prediction solution . Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12, Cary, North Carolina
Caglayan, Bora Et Al. "Dione an integrated measurement and defect prediction solution," Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12, Cary, North Carolina, 2012
Caglayan, Bora Et Al. "Dione an integrated measurement and defect prediction solution." Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12 , Cary, North Carolina, 2012
Caglayan, B. Et Al. (2012) . "Dione an integrated measurement and defect prediction solution." Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12 , Cary, North Carolina.
@conferencepaper{conferencepaper, author={Bora Caglayan Et Al. }, title={Dione an integrated measurement and defect prediction solution}, congress name={Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12}, city={Cary, North Carolina}, country={}, year={2012}}