Xhafa, X. Et Al. 2021. An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT , vol.70 .

Xhafa, X., Güngördü, A. D., Erol, D., Yavuz, Y., & Yelten, M. B., (2021). An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT , vol.70.

Xhafa, Xhesila Et Al. "An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors," IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT , vol.70, 2021

Xhafa, Xhesila Et Al. "An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors." IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT , vol.70, 2021

Xhafa, X. Et Al. (2021) . "An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors." IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT , vol.70.

@article{article, author={Xhesila Xhafa Et Al. }, title={An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors}, journal={IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT}, year=2021}