Y. Leblebici, "Design considerations for CMOS digital circuits with improved hot-carrier reliability," IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.31, no.7, pp.1014-1024, 1996
Leblebici, Y. 1996. Design considerations for CMOS digital circuits with improved hot-carrier reliability. IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.31, no.7 , 1014-1024.
Leblebici, Y., (1996). Design considerations for CMOS digital circuits with improved hot-carrier reliability. IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.31, no.7, 1014-1024.
Leblebici, Y. "Design considerations for CMOS digital circuits with improved hot-carrier reliability," IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.31, no.7, 1014-1024, 1996
Leblebici, Y. "Design considerations for CMOS digital circuits with improved hot-carrier reliability." IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.31, no.7, pp.1014-1024, 1996
Leblebici, Y. (1996) . "Design considerations for CMOS digital circuits with improved hot-carrier reliability." IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.31, no.7, pp.1014-1024.
@article{article, author={Y Leblebici}, title={Design considerations for CMOS digital circuits with improved hot-carrier reliability}, journal={IEEE JOURNAL OF SOLID-STATE CIRCUITS}, year=1996, pages={1014-1024} }