E. Soylemez Et Al. , "Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometry," REVIEW OF SCIENTIFIC INSTRUMENTS , vol.84, no.7, 2013
Soylemez, E. Et Al. 2013. Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometry. REVIEW OF SCIENTIFIC INSTRUMENTS , vol.84, no.7 .
Soylemez, E., Plass, R. A., Ashurst, W. R., & de Boer, M. P., (2013). Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometry. REVIEW OF SCIENTIFIC INSTRUMENTS , vol.84, no.7.
Soylemez, Emrecan Et Al. "Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometry," REVIEW OF SCIENTIFIC INSTRUMENTS , vol.84, no.7, 2013
Soylemez, Emrecan Et Al. "Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometry." REVIEW OF SCIENTIFIC INSTRUMENTS , vol.84, no.7, 2013
Soylemez, E. Et Al. (2013) . "Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometry." REVIEW OF SCIENTIFIC INSTRUMENTS , vol.84, no.7.
@article{article, author={Emrecan Söylemez Et Al. }, title={Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometry}, journal={REVIEW OF SCIENTIFIC INSTRUMENTS}, year=2013}