H. Oner Et Al. , "A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation," 1997 IEEE International Conference on Microelectronic Test Structures , Monterrey, Mexico, pp.72-76, 1997
Oner, H. Et Al. 1997. A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation. 1997 IEEE International Conference on Microelectronic Test Structures , (Monterrey, Mexico), 72-76.
Oner, H., Bayrakci, B., & Leblebici, Y., (1997). A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation . 1997 IEEE International Conference on Microelectronic Test Structures (pp.72-76). Monterrey, Mexico
Oner, H, B Bayrakci, And Y Leblebici. "A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation," 1997 IEEE International Conference on Microelectronic Test Structures, Monterrey, Mexico, 1997
Oner, H Et Al. "A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation." 1997 IEEE International Conference on Microelectronic Test Structures , Monterrey, Mexico, pp.72-76, 1997
Oner, H. Bayrakci, B. And Leblebici, Y. (1997) . "A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation." 1997 IEEE International Conference on Microelectronic Test Structures , Monterrey, Mexico, pp.72-76.
@conferencepaper{conferencepaper, author={H Oner Et Al. }, title={A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation}, congress name={1997 IEEE International Conference on Microelectronic Test Structures}, city={Monterrey}, country={Mexico}, year={1997}, pages={72-76} }