SANİÇ, M. T. And Yelten, M. B. 2018. Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING , vol.97, no.1 , 39-47.

SANİÇ, M. T., & Yelten, M. B., (2018). Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING , vol.97, no.1, 39-47.

SANİÇ, Mustafa, And Mustafa Berke Yelten. "Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits," ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING , vol.97, no.1, 39-47, 2018

SANİÇ, Mustafa T. And Yelten, Mustafa B. . "Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits." ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING , vol.97, no.1, pp.39-47, 2018

SANİÇ, M. T. And Yelten, M. B. (2018) . "Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits." ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING , vol.97, no.1, pp.39-47.

@article{article, author={Mustafa Tarik SANİÇ And author={Mustafa Berke Yelten}, title={Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits}, journal={ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING}, year=2018, pages={39-47} }