E. Basaran Et Al. , "A comparative study for profiling ultrathin boron layers in Si," CRYSTAL RESEARCH AND TECHNOLOGY , vol.38, no.12, pp.1037-1041, 2003
Basaran, E. Et Al. 2003. A comparative study for profiling ultrathin boron layers in Si. CRYSTAL RESEARCH AND TECHNOLOGY , vol.38, no.12 , 1037-1041.
Basaran, E., Addemir, O., Aslan, M., & Parker, E., (2003). A comparative study for profiling ultrathin boron layers in Si. CRYSTAL RESEARCH AND TECHNOLOGY , vol.38, no.12, 1037-1041.
Basaran, E Et Al. "A comparative study for profiling ultrathin boron layers in Si," CRYSTAL RESEARCH AND TECHNOLOGY , vol.38, no.12, 1037-1041, 2003
Basaran, E Et Al. "A comparative study for profiling ultrathin boron layers in Si." CRYSTAL RESEARCH AND TECHNOLOGY , vol.38, no.12, pp.1037-1041, 2003
Basaran, E. Et Al. (2003) . "A comparative study for profiling ultrathin boron layers in Si." CRYSTAL RESEARCH AND TECHNOLOGY , vol.38, no.12, pp.1037-1041.
@article{article, author={E Basaran Et Al. }, title={A comparative study for profiling ultrathin boron layers in Si}, journal={CRYSTAL RESEARCH AND TECHNOLOGY}, year=2003, pages={1037-1041} }