F. Kacar Et Al. , "A new approach of hot-carrier degradation and lifetime prediction for N-MOS transistors," 13th IEEE Mediterranean Electrotechnical Conference (MELECON 2006) , Benalmadena, Spain, pp.129-132, 2006
Kacar, F. Et Al. 2006. A new approach of hot-carrier degradation and lifetime prediction for N-MOS transistors. 13th IEEE Mediterranean Electrotechnical Conference (MELECON 2006) , (Benalmadena, Spain), 129-132.
Kacar, F., Kuntman, A., & Kuntman, H., (2006). A new approach of hot-carrier degradation and lifetime prediction for N-MOS transistors . 13th IEEE Mediterranean Electrotechnical Conference (MELECON 2006) (pp.129-132). Benalmadena, Spain
Kacar, Firat, Ayten Kuntman, And Hakan Kuntman. "A new approach of hot-carrier degradation and lifetime prediction for N-MOS transistors," 13th IEEE Mediterranean Electrotechnical Conference (MELECON 2006), Benalmadena, Spain, 2006
Kacar, Firat Et Al. "A new approach of hot-carrier degradation and lifetime prediction for N-MOS transistors." 13th IEEE Mediterranean Electrotechnical Conference (MELECON 2006) , Benalmadena, Spain, pp.129-132, 2006
Kacar, F. Kuntman, A. And Kuntman, H. (2006) . "A new approach of hot-carrier degradation and lifetime prediction for N-MOS transistors." 13th IEEE Mediterranean Electrotechnical Conference (MELECON 2006) , Benalmadena, Spain, pp.129-132.
@conferencepaper{conferencepaper, author={Firat Kacar Et Al. }, title={A new approach of hot-carrier degradation and lifetime prediction for N-MOS transistors}, congress name={13th IEEE Mediterranean Electrotechnical Conference (MELECON 2006)}, city={Benalmadena}, country={Spain}, year={2006}, pages={129-132} }