I. Koyuncu Et Al. , "A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography," JOURNAL OF MEMBRANE SCIENCE , vol.278, pp.410-417, 2006
Koyuncu, I. Et Al. 2006. A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography. JOURNAL OF MEMBRANE SCIENCE , vol.278 , 410-417.
Koyuncu, I., Brant, J., Luttge, A., & Wiesner, M. R., (2006). A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography. JOURNAL OF MEMBRANE SCIENCE , vol.278, 410-417.
Koyuncu, İsmail Et Al. "A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography," JOURNAL OF MEMBRANE SCIENCE , vol.278, 410-417, 2006
Koyuncu, İsmail Et Al. "A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography." JOURNAL OF MEMBRANE SCIENCE , vol.278, pp.410-417, 2006
Koyuncu, I. Et Al. (2006) . "A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography." JOURNAL OF MEMBRANE SCIENCE , vol.278, pp.410-417.
@article{article, author={İsmail Koyuncu Et Al. }, title={A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography}, journal={JOURNAL OF MEMBRANE SCIENCE}, year=2006, pages={410-417} }