S. SULİMAN Et Al. , "The dependence of UMOSFET characteristics and reliability on geometry and processing," SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.16, no.6, pp.447-454, 2001
SULİMAN, S. Et Al. 2001. The dependence of UMOSFET characteristics and reliability on geometry and processing. SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.16, no.6 , 447-454.
SULİMAN, S., GOLLAGUNTA, N., Trabzon, L., HAO, J., RİDLEY, R., Knoedler, C., ... Dolny, G.(2001). The dependence of UMOSFET characteristics and reliability on geometry and processing. SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.16, no.6, 447-454.
SULİMAN, SA Et Al. "The dependence of UMOSFET characteristics and reliability on geometry and processing," SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.16, no.6, 447-454, 2001
SULİMAN, SA Et Al. "The dependence of UMOSFET characteristics and reliability on geometry and processing." SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.16, no.6, pp.447-454, 2001
SULİMAN, S. Et Al. (2001) . "The dependence of UMOSFET characteristics and reliability on geometry and processing." SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.16, no.6, pp.447-454.
@article{article, author={SA SULİMAN Et Al. }, title={The dependence of UMOSFET characteristics and reliability on geometry and processing}, journal={SEMICONDUCTOR SCIENCE AND TECHNOLOGY}, year=2001, pages={447-454} }