M. B. Yelten Et Al. , "Surrogate-Model-Based Analysis of Analog Circuits-Part I: Variability Analysis," IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY , vol.11, no.3, pp.466-473, 2011
Yelten, M. B. Et Al. 2011. Surrogate-Model-Based Analysis of Analog Circuits-Part I: Variability Analysis. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY , vol.11, no.3 , 466-473.
Yelten, M. B., Franzon, P. D., & Steer, M. B., (2011). Surrogate-Model-Based Analysis of Analog Circuits-Part I: Variability Analysis. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY , vol.11, no.3, 466-473.
Yelten, Mustafa, Paul D. Franzon, And Michael B. Steer. "Surrogate-Model-Based Analysis of Analog Circuits-Part I: Variability Analysis," IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY , vol.11, no.3, 466-473, 2011
Yelten, Mustafa B. Et Al. "Surrogate-Model-Based Analysis of Analog Circuits-Part I: Variability Analysis." IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY , vol.11, no.3, pp.466-473, 2011
Yelten, M. B. Franzon, P. D. And Steer, M. B. (2011) . "Surrogate-Model-Based Analysis of Analog Circuits-Part I: Variability Analysis." IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY , vol.11, no.3, pp.466-473.
@article{article, author={Mustafa Berke Yelten Et Al. }, title={Surrogate-Model-Based Analysis of Analog Circuits-Part I: Variability Analysis}, journal={IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY}, year=2011, pages={466-473} }