S. İlik Et Al. , "Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.66, no.11, pp.4617-4622, 2019
İlik, S. Et Al. 2019. Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.66, no.11 , 4617-4622.
İlik, S., Kabaoglu, A., Solmaz, N. S., & Yelten, M. B., (2019). Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.66, no.11, 4617-4622.
İlik, Sadık Et Al. "Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.66, no.11, 4617-4622, 2019
İlik, Sadık Et Al. "Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.66, no.11, pp.4617-4622, 2019
İlik, S. Et Al. (2019) . "Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.66, no.11, pp.4617-4622.
@article{article, author={Sadık İlik Et Al. }, title={Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3}, journal={IEEE TRANSACTIONS ON ELECTRON DEVICES}, year=2019, pages={4617-4622} }