D. LEBRUN Et Al. , "AN OPTOELECTRONIC IMAGING-SYSTEM FOR PARTICLE CHARACTERIZATION," JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE , vol.26, no.1, pp.39-48, 1995
LEBRUN, D. Et Al. 1995. AN OPTOELECTRONIC IMAGING-SYSTEM FOR PARTICLE CHARACTERIZATION. JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE , vol.26, no.1 , 39-48.
LEBRUN, D., OZKUL, C., KLEITZ, A., TOUIL, C., & ROTH, R., (1995). AN OPTOELECTRONIC IMAGING-SYSTEM FOR PARTICLE CHARACTERIZATION. JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE , vol.26, no.1, 39-48.
LEBRUN, D Et Al. "AN OPTOELECTRONIC IMAGING-SYSTEM FOR PARTICLE CHARACTERIZATION," JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE , vol.26, no.1, 39-48, 1995
LEBRUN, D Et Al. "AN OPTOELECTRONIC IMAGING-SYSTEM FOR PARTICLE CHARACTERIZATION." JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE , vol.26, no.1, pp.39-48, 1995
LEBRUN, D. Et Al. (1995) . "AN OPTOELECTRONIC IMAGING-SYSTEM FOR PARTICLE CHARACTERIZATION." JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE , vol.26, no.1, pp.39-48.
@article{article, author={D LEBRUN Et Al. }, title={AN OPTOELECTRONIC IMAGING-SYSTEM FOR PARTICLE CHARACTERIZATION}, journal={JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE}, year=1995, pages={39-48} }