S. Özcan Kini And A. TOSUN, "Periodic Developer Metrics in Software Defect Prediction," 2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM) , Madrid, Spain, 2018
Özcan Kini, S. And TOSUN, A. 2018. Periodic Developer Metrics in Software Defect Prediction. 2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM) , (Madrid, Spain).
Özcan Kini, S., & TOSUN, A., (2018). Periodic Developer Metrics in Software Defect Prediction . 2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM), Madrid, Spain
Özcan Kini, Seldağ, And Ayşe Tosun Kühn. "Periodic Developer Metrics in Software Defect Prediction," 2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM), Madrid, Spain, 2018
Özcan Kini, Seldağ Ö. And TOSUN, Ayşe T. . "Periodic Developer Metrics in Software Defect Prediction." 2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM) , Madrid, Spain, 2018
Özcan Kini, S. And TOSUN, A. (2018) . "Periodic Developer Metrics in Software Defect Prediction." 2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM) , Madrid, Spain.
@conferencepaper{conferencepaper, author={Seldağ Özcan Kini And author={Ayşe Tosun Kühn}, title={Periodic Developer Metrics in Software Defect Prediction}, congress name={2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM)}, city={Madrid}, country={Spain}, year={2018}}