O. YUZUGULLU Et Al. , "GLOBAL SENSITIVITY ANALYSIS OF A MORPHOLOGY BASED ELECTROMAGNETIC SCATTERING MODEL," IEEE International Geoscience and Remote Sensing Symposium (IGARSS) , Milan, Italy, pp.2743-2746, 2015
YUZUGULLU, O. Et Al. 2015. GLOBAL SENSITIVITY ANALYSIS OF A MORPHOLOGY BASED ELECTROMAGNETIC SCATTERING MODEL. IEEE International Geoscience and Remote Sensing Symposium (IGARSS) , (Milan, Italy), 2743-2746.
YUZUGULLU, O., Marelli, S., Erten, E., Sudret, B., & HAJNSEK, I., (2015). GLOBAL SENSITIVITY ANALYSIS OF A MORPHOLOGY BASED ELECTROMAGNETIC SCATTERING MODEL . IEEE International Geoscience and Remote Sensing Symposium (IGARSS) (pp.2743-2746). Milan, Italy
YUZUGULLU, Onur Et Al. "GLOBAL SENSITIVITY ANALYSIS OF A MORPHOLOGY BASED ELECTROMAGNETIC SCATTERING MODEL," IEEE International Geoscience and Remote Sensing Symposium (IGARSS), Milan, Italy, 2015
YUZUGULLU, Onur Et Al. "GLOBAL SENSITIVITY ANALYSIS OF A MORPHOLOGY BASED ELECTROMAGNETIC SCATTERING MODEL." IEEE International Geoscience and Remote Sensing Symposium (IGARSS) , Milan, Italy, pp.2743-2746, 2015
YUZUGULLU, O. Et Al. (2015) . "GLOBAL SENSITIVITY ANALYSIS OF A MORPHOLOGY BASED ELECTROMAGNETIC SCATTERING MODEL." IEEE International Geoscience and Remote Sensing Symposium (IGARSS) , Milan, Italy, pp.2743-2746.
@conferencepaper{conferencepaper, author={Onur YUZUGULLU Et Al. }, title={GLOBAL SENSITIVITY ANALYSIS OF A MORPHOLOGY BASED ELECTROMAGNETIC SCATTERING MODEL}, congress name={IEEE International Geoscience and Remote Sensing Symposium (IGARSS)}, city={Milan}, country={Italy}, year={2015}, pages={2743-2746} }