I. Ç. ODABAŞI Et Al. , "A rare event based yield estimation methodology for analog circuits," 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 , Budapest, Hungary, pp.33-38, 2018
ODABAŞI, I. Ç. Et Al. 2018. A rare event based yield estimation methodology for analog circuits. 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 , (Budapest, Hungary), 33-38.
ODABAŞI, I. Ç., Yelten, M. B., AFACAN, E., Baskaya, F., Pusane, A. E., & Dündar, G., (2018). A rare event based yield estimation methodology for analog circuits . 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 (pp.33-38). Budapest, Hungary
ODABAŞI, Izel Et Al. "A rare event based yield estimation methodology for analog circuits," 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018, Budapest, Hungary, 2018
ODABAŞI, Izel Ç. Et Al. "A rare event based yield estimation methodology for analog circuits." 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 , Budapest, Hungary, pp.33-38, 2018
ODABAŞI, I. Ç. Et Al. (2018) . "A rare event based yield estimation methodology for analog circuits." 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 , Budapest, Hungary, pp.33-38.
@conferencepaper{conferencepaper, author={Izel Çaǧin ODABAŞI Et Al. }, title={A rare event based yield estimation methodology for analog circuits}, congress name={21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018}, city={Budapest}, country={Hungary}, year={2018}, pages={33-38} }