C. Ornek Et Al. , "Characterization of 475 degrees C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy," JOURNAL OF THE ELECTROCHEMICAL SOCIETY , vol.164, no.6, 2017
Ornek, C. Et Al. 2017. Characterization of 475 degrees C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy. JOURNAL OF THE ELECTROCHEMICAL SOCIETY , vol.164, no.6 .
Ornek, C., Walton, J., Hashimoto, T., Ladwein, T. L., Lyon, S. B., & Engelberg, D. L., (2017). Characterization of 475 degrees C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy. JOURNAL OF THE ELECTROCHEMICAL SOCIETY , vol.164, no.6.
Ornek, Cem Et Al. "Characterization of 475 degrees C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy," JOURNAL OF THE ELECTROCHEMICAL SOCIETY , vol.164, no.6, 2017
Ornek, Cem Et Al. "Characterization of 475 degrees C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy." JOURNAL OF THE ELECTROCHEMICAL SOCIETY , vol.164, no.6, 2017
Ornek, C. Et Al. (2017) . "Characterization of 475 degrees C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy." JOURNAL OF THE ELECTROCHEMICAL SOCIETY , vol.164, no.6.
@article{article, author={Cem Örnek Et Al. }, title={Characterization of 475 degrees C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy}, journal={JOURNAL OF THE ELECTROCHEMICAL SOCIETY}, year=2017}