Statistical design of low power square-law CMOS cells for high yield


Tarim T., Kuntman H., Ismail M.

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, cilt.23, ss.237-248, 2000 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 23 Konu: 3
  • Basım Tarihi: 2000
  • Doi Numarası: 10.1023/a:1008319604774
  • Dergi Adı: ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
  • Sayfa Sayıları: ss.237-248

Özet

A robust design of low voltage low power square law CMOS composite cells using statistical VLSI design techniques is presented. Since random device/process variations do not scale down with feature size or supply voltage, the statistical design of low voltage circuits is essential in order to keep functional yields of low voltage circuits at levels that are competitive and cost effective. The Response Surface Methodology and Design of Experiment techniques were used as statistical techniques. This article shows that statistical techniques will result in area/layout optimization which will enhance functional yield of low voltage analog ICs.