Residual Stresses in Zr Hf N Films up to 11 9 at Hf Measured by X ray Diffraction Using Experimentally Calculated XECs


ATAR E., Sarıoglu C., Çimenoğlu H. , KAYALI E. S.

Surface and Coatings Technology, cilt.191, ss.188-194, 2005 (SSCI İndekslerine Giren Dergi)

  • Cilt numarası: 191 Konu: 2
  • Basım Tarihi: 2005
  • Dergi Adı: Surface and Coatings Technology
  • Sayfa Sayıları: ss.188-194