Two-class Linear Discriminant Analysis for Face Recognition

Ekenel H. K., STIEFELHAGEN R.

IEEE Signal Processing and Communications Applications Conference (SIU), Eskişehir, Turkey, 11 - 13 June 2007, pp.1-4

  • Publication Type: Conference Paper / Full Text
  • City: Eskişehir
  • Country: Turkey
  • Page Numbers: pp.1-4
  • Istanbul Technical University Affiliated: Yes