Selection and combination of local Gabor classifiers for robust face verification

Arar N. M., GAO H., Ekenel H. K., Akarun L.

2012 IEEE 5th International Conference on Biometrics: Theory, Applications and Systems, BTAS 2012, Arlington, VA, United States Of America, 23 - 27 September 2012, pp.297-302 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/btas.2012.6374592
  • City: Arlington, VA
  • Country: United States Of America
  • Page Numbers: pp.297-302
  • Istanbul Technical University Affiliated: Yes