A PULSED INTERFACE-PROBING TECHNIQUE FOR MOS INTERFACE CHARACTERIZATION AT MID-GAP LEVELS


CILINGIROGLU U.

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol.35, no.12, pp.2391-2396, 1988 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 35 Issue: 12
  • Publication Date: 1988
  • Doi Number: 10.1109/16.8820
  • Title of Journal : IEEE TRANSACTIONS ON ELECTRON DEVICES
  • Page Numbers: pp.2391-2396