A PULSED INTERFACE-PROBING TECHNIQUE FOR MOS INTERFACE CHARACTERIZATION AT MID-GAP LEVELS

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CILINGIROGLU U.

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol.35, no.12, pp.2391-2396, 1988 (SCI-Expanded)

• Publication Type: Article / Article
• Volume: 35 Issue: 12
• Publication Date: 1988
• Doi Number: 10.1109/16.8820
• Journal Name: IEEE TRANSACTIONS ON ELECTRON DEVICES
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.2391-2396
• Istanbul Technical University Affiliated: No