Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm

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ÇELİK Ü., Uysallı Y., Kehribar İ., ÇELİK K., ÖZER H. Ö., ORAL A.

The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN, 17 - 19 May 2017

• Publication Type: Conference Paper / Summary Text
• Istanbul Technical University Affiliated: Yes