Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC)


Abas M. A. , Russell G., Kinniment D. J.

8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics, İstanbul, Turkey, 30 May - 01 June 2009, pp.17-18 identifier

  • Publication Type: Conference Paper / Full Text
  • City: İstanbul
  • Country: Turkey
  • Page Numbers: pp.17-18

Abstract

This paper presents two high-resolution timing measurement BIST for digital SoC applications, namely: Two-Delay Interpolation Method (TDIM) and Time Amplifier. The two schemes are combined to produce a completely new design for BIST time measurement which offers two main advantages: a low range of timing measurement which has never been achieved before, and a small size of layout occupying 0.2 mm(2) or equivalent to 3020 transistors. These two features are undoubtedly compatible with present high-speed SOC design architectures. Measurement technique for three common types of Jitter were studied and explained to justify the capabilities of the schemes.