Electromagnetic Imaging of Rough Dielectric Surface Profiles using a Single-Frequency Reverse Time Migration Method


Sefer A., Yapar A., Bagci H.

2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023, Oregon, United States Of America, 23 - 28 July 2023, vol.2023-July, pp.467-468 identifier

  • Publication Type: Conference Paper / Full Text
  • Volume: 2023-July
  • Doi Number: 10.1109/usnc-ursi52151.2023.10237795
  • City: Oregon
  • Country: United States Of America
  • Page Numbers: pp.467-468
  • Keywords: electromagnetic imaging, Inverse electromagnetic scattering, reverse time migration, rough surface
  • Istanbul Technical University Affiliated: Yes

Abstract

An electromagnetic imaging scheme, which makes use of a single-frequency reverse time migration (RTM) technique to reconstruct two-dimensional (2D) rough surface profiles from the scattered field data, is formulated and implemented. The unknown surface profile, which is expressed as a one-dimensional height function, is the interface between two dielectric media. It is assumed that the profile is illuminated from one side and the scattered fields are 'measured' along a line on this same side. RTM is used to construct a cross-correlation imaging functional that is numerically evaluated to yield an image of the investigation domain. The maxima of this functional yields an accurate reconstruction of the rough dielectric surface profile.