Dione an integrated measurement and defect prediction solution


Caglayan B., TOSUN A., Gul C., Ayse B., Aytac T., Turhan B.

Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering - FSE ’xx12, Cary, North Carolina, 11 - 16 November 2012

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1145/2393596.2393619
  • City: Cary, North Carolina
  • Istanbul Technical University Affiliated: No