A Fast Logic Mapping Algorithm for Multiple-type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays | AVESİS

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A Fast Logic Mapping Algorithm for Multiple-type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays

IEEE TRANSACTİONS ON EMERGİNG TOPİCS İN COMPUTİNG, vol.0, no.0, 2017 (Refereed Journals of Other Institutions)

Publication Type: Article / Article
Volume: 0 Issue: 0
Publication Date: 2017
Title of Journal : IEEE TRANSACTİONS ON EMERGİNG TOPİCS İN COMPUTİNG