Determination of Optical Constants and Band Gap of SiC Thin Films Deposited by Reactive DC Magnetron Sputtering | AVESİS

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Determination of Optical Constants and Band Gap of SiC Thin Films Deposited by Reactive DC Magnetron Sputtering

Özkan Zayim E. , Yücel O. , Ağırseven O., Tavşanoğlu T.

1st Surface Treatment Symposium, İstanbul, Turkey, 15 - 18 June 2011, pp.1294-1301

Publication Type: Conference Paper / Full Text
City: İstanbul
Country: Turkey
Page Numbers: pp.1294-1301