Dynamical analysis of sputtering at threshold energy range: Modelling of Ar+Ni(100) collision system


Hundur Y., Guvenc Z. B., HIPPLER R.

CHINESE PHYSICS LETTERS, cilt.25, sa.2, ss.730-733, 2008 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 25 Sayı: 2
  • Basım Tarihi: 2008
  • Doi Numarası: 10.1088/0256-307x/25/2/102
  • Dergi Adı: CHINESE PHYSICS LETTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.730-733
  • İstanbul Teknik Üniversitesi Adresli: Evet

Özet

The sputtering process of Ar+Ni(100) collision systems is investigated by means of constant energy molecular dynamics simulations. The Ni(100) slab is mimicked by an embedded-atom potential, and the interaction between the projectile and the surface is modelled by using the reparametrized ZBL potential. Ni atom emission from the lattice is analysed over the range of 20-50 eV collision energy. Sputtering yield, angular and energy distributions of the scattered Ar and of the sputtered Ni atoms are calculated, and compared to the available theoretical and experimental data.