Identification of insect damaged wheat kernels using transmittance images

Cataltepe Z., CETIN A., PEARSON T.

ELECTRONICS LETTERS, vol.41, no.5, pp.238-240, 2005 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 41 Issue: 5
  • Publication Date: 2005
  • Doi Number: 10.1049/el:20047250
  • Journal Name: ELECTRONICS LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.238-240
  • Istanbul Technical University Affiliated: No

Abstract

Transmittance images of wheat kernels are used to classify insect damaged and undamaged wheat kemels. The histogram of pixel intensities of the wheat images were used as the features. Combination of the linear model and a radial basis function network in a committee resulted in a false positive rate of 0.1 at the true positive rate of 0.8 and an area under the receiver operating characteristics curve of 0.92.