A fast and robust scan matching algorithm based on ML NDT and feature extraction | AVESİS

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A fast and robust scan matching algorithm based on ML NDT and feature extraction

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Ulas C., TEMELTAŞ H.

2011 IEEE International Conference on Mechatronics and Automation, Beijing, China, 7 - 10 August 2011, pp.1751-1756

Publication Type: Conference Paper / Full Text
Doi Number: 10.1109/icma.2011.5986244
City: Beijing, China
Page Numbers: pp.1751-1756
Istanbul Technical University Affiliated: Yes