Stress-induced changes in phonon frequencies of ZrSiO4: Infrared spectroscopy-based pressure sensor

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Mansoor M., Mansoor M., Mansoor M., Er Z., Czelej K., Uergen M.

SOLID STATE COMMUNICATIONS, vol.357, 2022 (SCI-Expanded) identifier identifier identifier

  • Publication Type: Article / Article
  • Volume: 357
  • Publication Date: 2022
  • Doi Number: 10.1016/j.ssc.2022.114983
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, PASCAL, Aerospace Database, Chemical Abstracts Core, Communication Abstracts, INSPEC, Metadex, DIALNET, Civil Engineering Abstracts
  • Keywords: Pressure transducer, Ab-initio, Zircon, Raman spectroscopy, IR Spectroscopy, DIAMOND
  • Istanbul Technical University Affiliated: Yes


Functional materials that can serve as high-pressure transducers are limited, making such sensor material sought after. It has been reported that hydrostatic pressures highly influence Raman shifts of ZrSiO4. Therefore, zir-conium silicate has been suggested as a Raman spectroscopic pressure sensor. However, mass applications of a Raman-based sensor technology poses a wide range of challenges. We demonstrate that ZrSiO4 also exhibits pressure-dependent infrared (IR) spectra. Furthermore, the IR peaks of ZrSiO4 are sensitive to shear stresses and non-hydrostatic pressures, making this material a unique sensor for determining a variety of mechanical stresses through IR spectroscopy.