Analog Negative-Bias-Temperature-Instability Monitoring Circuit


Yelten M. B. , Franzon P. D. , Steer M. B.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, vol.12, no.1, pp.177-179, 2012 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 12 Issue: 1
  • Publication Date: 2012
  • Doi Number: 10.1109/tdmr.2011.2178096
  • Title of Journal : IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
  • Page Numbers: pp.177-179

Abstract

A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The subcircuit can be incorporated in various analog circuit blocks subject to different variability, stress, and aging histories. For an amplifier block, the NBTI monitor is a linear sensor, and sensing is provided as variation of the amplifier gain in response to NBTI-induced bias variation. The monitor sensitivity in this configuration is 3.15 V-1 and is demonstrated through electrothermal stress on the amplifier circuit.