Analog Negative-Bias-Temperature-Instability Monitoring Circuit

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Atıf İçin Kopyala

Yelten M. B., Franzon P. D., Steer M. B.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, cilt.12, sa.1, ss.177-179, 2012 (SCI-Expanded)

• Yayın Türü: Makale / Tam Makale
• Cilt numarası: 12 Sayı: 1
• Basım Tarihi: 2012
• Doi Numarası: 10.1109/tdmr.2011.2178096
• Dergi Adı: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
• Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Sayfa Sayıları: ss.177-179
• İstanbul Teknik Üniversitesi Adresli: Hayır

Özet

A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The subcircuit can be incorporated in various analog circuit blocks subject to different variability, stress, and aging histories. For an amplifier block, the NBTI monitor is a linear sensor, and sensing is provided as variation of the amplifier gain in response to NBTI-induced bias variation. The monitor sensitivity in this configuration is 3.15 V-1 and is demonstrated through electrothermal stress on the amplifier circuit.