Analog Negative-Bias-Temperature-Instability Monitoring Circuit


Yelten M. B. , Franzon P. D. , Steer M. B.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, cilt.12, sa.1, ss.177-179, 2012 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 12 Konu: 1
  • Basım Tarihi: 2012
  • Doi Numarası: 10.1109/tdmr.2011.2178096
  • Dergi Adı: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
  • Sayfa Sayıları: ss.177-179

Özet

A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The subcircuit can be incorporated in various analog circuit blocks subject to different variability, stress, and aging histories. For an amplifier block, the NBTI monitor is a linear sensor, and sensing is provided as variation of the amplifier gain in response to NBTI-induced bias variation. The monitor sensitivity in this configuration is 3.15 V-1 and is demonstrated through electrothermal stress on the amplifier circuit.