How image degradations affect deep CNN-based Face recognition?

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KARAHAN Ş., YILDIRIM M. K., KIRTAÇ K., RENDE F. Ş., BÜTÜN G., Ekenel H. K.

15th International Conference of the Biometrics Special Interest Group, BIOSIG 2016, Darmstadt, Germany, 21 - 23 September 2016

• Publication Type: Conference Paper / Full Text
• Doi Number: 10.1109/biosig.2016.7736924
• City: Darmstadt
• Country: Germany
• Istanbul Technical University Affiliated: Yes