How image degradations affect deep CNN-based Face recognition?


KARAHAN Ş., YILDIRIM M. K., KIRTAÇ K., RENDE F. Ş., BÜTÜN G., Ekenel H. K.

15th International Conference of the Biometrics Special Interest Group, BIOSIG 2016, Darmstadt, Germany, 21 - 23 September 2016 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/biosig.2016.7736924
  • City: Darmstadt
  • Country: Germany
  • Istanbul Technical University Affiliated: Yes