Multi-resolution local appearance-based face verification

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GAO H., Ekenel H. K., FISCHER M., STIEFELHAGEN R.

2010 20th International Conference on Pattern Recognition, ICPR 2010, İstanbul, Turkey, 23 - 26 August 2010, pp.1501-1504

• Publication Type: Conference Paper / Full Text
• Doi Number: 10.1109/icpr.2010.371
• City: İstanbul
• Country: Turkey
• Page Numbers: pp.1501-1504
• Istanbul Technical University Affiliated: No