Multi-resolution local appearance-based face verification


GAO H., Ekenel H. K. , FISCHER M., STIEFELHAGEN R.

2010 20th International Conference on Pattern Recognition, ICPR 2010, İstanbul, Turkey, 23 - 26 August 2010, pp.1501-1504 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/icpr.2010.371
  • City: İstanbul
  • Country: Turkey
  • Page Numbers: pp.1501-1504