Damage to n MOSFETs from electrical stress relationship to processing damage and impact on device relaibility


Trabzon L., awadelkarim o.

MICROELECTRONICS RELIABILITY, vol.38, no.4, pp.651-657, 1998 (SCI-Expanded)

  • Publication Type: Article / Article
  • Volume: 38 Issue: 4
  • Publication Date: 1998
  • Journal Name: MICROELECTRONICS RELIABILITY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.651-657
  • Istanbul Technical University Affiliated: Yes