Radiation pressure excitation of Low Temperature Atomic Force Magnetic Force Microscope LT AFM MFM in 4 300K Temperature Range


Karcı Ö., Çelik Ü., Uysallı Y., ÖZER H. Ö. , ORAL A.

16th European Conference on Applications of Surface and Interface Analysis, ECASIA'15, Granada, İspanya, 28 September - 01 October 2015

  • Publication Type: Conference Paper / Summary Text