Face alignment by minimizing the closest classification distance


Ekenel H. K. , STIEFELHAGEN R.

IEEE 3rd International Conference on Biometrics: Theory, Applications and Systems, BTAS 2009, Washington, United States Of America, 28 - 30 September 2009 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/btas.2009.5339076
  • City: Washington
  • Country: United States Of America