Wafer test probe burn modeling and characterization


ZAFER B., Vishkasougheh H. M., TUNABOYLU B.

14th International Conference on Thermal, Mechanical and Multi-Physics Simulation, 15 - 17 Nisan 2013

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • İstanbul Teknik Üniversitesi Adresli: Evet