Characterization of diffraction patterns directly from in-line holograms with the fractional Fourier transform


COETMELLEC S., LEBRUN D., Ozkul C.

APPLIED OPTICS, vol.41, no.2, pp.312-319, 2002 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 41 Issue: 2
  • Publication Date: 2002
  • Doi Number: 10.1364/ao.41.000312
  • Title of Journal : APPLIED OPTICS
  • Page Numbers: pp.312-319

Abstract

We show that the fractional Fourier transform is a suitable mechanism with which to analyze the diffraction patterns produced by a one-dimensional object because its intensity distribution is partially described by a linear chirp function. The three-dimensional location and the diameter of a fiber can be determined, provided that the optimal fractional order is selected. The effect of compaction of the intensity distribution in the fractional Fourier domain is discussed. A few experimental results are presented. (C) 2002 Optical Society of America.