Characterization of diffraction patterns directly from in-line holograms with the fractional Fourier transform

COETMELLEC S., LEBRUN D., Ozkul C.

APPLIED OPTICS, cilt.41, sa.2, ss.312-319, 2002 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 41 Sayı: 2
  • Basım Tarihi: 2002
  • Doi Numarası: 10.1364/ao.41.000312
  • Dergi Adı: APPLIED OPTICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.312-319
  • İstanbul Teknik Üniversitesi Adresli: Hayır

Özet

We show that the fractional Fourier transform is a suitable mechanism with which to analyze the diffraction patterns produced by a one-dimensional object because its intensity distribution is partially described by a linear chirp function. The three-dimensional location and the diameter of a fiber can be determined, provided that the optimal fractional order is selected. The effect of compaction of the intensity distribution in the fractional Fourier domain is discussed. A few experimental results are presented. (C) 2002 Optical Society of America.