Application of wavelet transform to hologram analysis: three-dimensional location of particles


BURAGA-LEFEBVRE C., COETMELLEC S., LEBRUN D., Ozkul C.

OPTICS AND LASERS IN ENGINEERING, vol.33, no.6, pp.409-421, 2000 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 33 Issue: 6
  • Publication Date: 2000
  • Doi Number: 10.1016/s0143-8166(00)00050-6
  • Title of Journal : OPTICS AND LASERS IN ENGINEERING
  • Page Numbers: pp.409-421

Abstract

The wavelet analysis provides an efficient tool in numerous signal-processing problems and has been implemented in optical processing techniques, such as in-line holography. When the diffraction pattern recorded on a hologram is analyzed by means of a wavelet transform, the 3-D location of small particles can be determined very accurately. The diffraction process can, in fact, be interpreted as a convolution with a family of wavelet functions, or, merely, as a wavelet transform. The scale parameter of the wavelet family is related to the axial distance z that the wave propagates. The original field is then reconstructed by searching for the optimum value of the scale parameter which produces a maximum of the wavelet transform modulus. The technique proposed is implemented and experimental results are presented. (C) 2000 Elsevier Science Ltd. All rights reserved.