The Effects of Interlayer Dıelectric Deposition and Processing on the Reliability of n channel Transistors


Trabzon L. , Awadelkarim O., Werking J.

SOLID-STATE ELECTRONICS, vol.42, no.11, pp.2031-2037, 1998 (Journal Indexed in SCI Expanded)

  • Publication Type: Article / Article
  • Volume: 42 Issue: 11
  • Publication Date: 1998
  • Title of Journal : SOLID-STATE ELECTRONICS
  • Page Numbers: pp.2031-2037