The Effects of Interlayer Dıelectric Deposition and Processing on the Reliability of n channel Transistors

Trabzon L., Awadelkarim O., Werking J.

SOLID-STATE ELECTRONICS, vol.42, no.11, pp.2031-2037, 1998 (SCI-Expanded)

  • Publication Type: Article / Article
  • Volume: 42 Issue: 11
  • Publication Date: 1998
  • Journal Name: SOLID-STATE ELECTRONICS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.2031-2037
  • Istanbul Technical University Affiliated: Yes