Electro-optical measurements of ultrashort 45 MeV electron beam bunch

Nikas D., Castillo V., KOWALSKI L., LARSEN R., LAZARUS D., Ozben C. Ş., ...Daha Fazla

INTERNATIONAL JOURNAL OF MODERN PHYSICS A, cilt.16, ss.1150-1152, 2001 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 16
  • Basım Tarihi: 2001
  • Doi Numarası: 10.1142/s0217751x01009168
  • Dergi Adı: INTERNATIONAL JOURNAL OF MODERN PHYSICS A
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1150-1152
  • İstanbul Teknik Üniversitesi Adresli: Hayır

Özet

We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the optical beam path distance from the electron beam. The risetime of the signal was bandwidth limited by our detection system to similar to 70 ps. An EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. The EO technique may be ideal for the measurement of bunch structure with femtosecond resolution of relativistic charged particle beam bunches.