Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(100)(2 x 1) with small oscillation amplitudes


Ozer H. Ö. , ATABAK M., ELLIALTIOGLU R., ORAL A.

APPLIED SURFACE SCIENCE, cilt.188, ss.301-305, 2002 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 188
  • Basım Tarihi: 2002
  • Doi Numarası: 10.1016/s0169-4332(01)00942-4
  • Dergi Adı: APPLIED SURFACE SCIENCE
  • Sayfa Sayıları: ss.301-305

Özet

Si(1 0 0)(2 x 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Angstrom oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. (C) 2002 Elsevier Science B.V. All rights reserved.