Effect of Temperature and Film Thickness on Residual Stress and Texture of Re2O3 Buffer Layers for YBCO Coated Conductor


Arda L., Ataoğlu Ş., BULUT O.

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, vol.19, no.3, pp.3291-3294, 2009 (SCI-Expanded) identifier identifier

Abstract

Re2O3 (Re = Er,Gd, Ho, Y and Yb) was prepared by sol-gel synthesis using metal-organic precursors. Residual stress and microstructure in the Re2O3 buffer layers were investigated as a function of temperature and film thickness. Textured Re2O3 buffer layers were grown on biaxially textured-Ni (100) substrates using chemical solution deposition. Films were annealed at 1150 degrees C under a flowing 4% H-2-Ar gas. X-ray diffraction of the buffers showed strong out-of-plane orientation on Ni tape. Residual stress in various thicknesses of buffer layers was calculated. The surface morphologies and microstructure of all samples were characterized using SEM and AFM.