Suspect identification based on descriptive facial attributes

Klare B. F. , Klum S., Klontz J. C. , Taborsky E., Akgül T. , Jain A. K.

2nd IEEE/IAPR International Joint Conference on Biometrics, IJCB 2014, Florida, United States Of America, 29 September - 02 October 2014 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/btas.2014.6996255
  • City: Florida
  • Country: United States Of America