Reducing false alarms in software defect prediction by decision threshold optimization

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TOSUN A. , Bener A.

2009 3rd International Symposium on Empirical Software Engineering and Measurement, Lake Buena Vista, FL, USA, 15 - 16 October 2009

• Publication Type: Conference Paper / Full Text
• Doi Number: 10.1109/esem.2009.5316006
• City: Lake Buena Vista, FL, USA