Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

Srinivasan-Rao T., AMIN M., Castillo V., LAZARUS D., NIKAS D., Ozben C. Ş., ...More

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, vol.5, no.4, 2002 (SCI-Expanded) identifier identifier


A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.