Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

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Atıf İçin Kopyala

Srinivasan-Rao T., AMIN M., Castillo V., LAZARUS D., NIKAS D., Ozben C. Ş., ...Daha Fazla

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, cilt.5, sa.4, 2002 (SCI-Expanded)

• Yayın Türü: Makale / Tam Makale
• Cilt numarası: 5 Sayı: 4
• Basım Tarihi: 2002
• Doi Numarası: 10.1103/physrevstab.5.042801
• Dergi Adı: PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS
• Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Directory of Open Access Journals
• İstanbul Teknik Üniversitesi Adresli: Hayır

Özet

A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.