Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique


Srinivasan-Rao T., AMIN M., Castillo V., LAZARUS D., NIKAS D., Ozben C. Ş. , ...Daha Fazla

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, cilt.5, 2002 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 5 Konu: 4
  • Basım Tarihi: 2002
  • Doi Numarası: 10.1103/physrevstab.5.042801
  • Dergi Adı: PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS

Özet

A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.