Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique


Srinivasan-Rao T., AMIN M., Castillo V., LAZARUS D., NIKAS D., Ozben C. Ş. , ...More

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, vol.5, no.4, 2002 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 5 Issue: 4
  • Publication Date: 2002
  • Doi Number: 10.1103/physrevstab.5.042801
  • Title of Journal : PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS

Abstract

A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.